SPIE Photonics West 2012

21-26 January 2012

The Moscone Center,
San Francisco,
California,
USA

Our booth # 1107
(South Hall)

Test & Measurements

The test facilities we have implemented to better understand and guarantee the properties of our materials can also be used on our customers' request. We would be proud to let them benefit from our expertize in the following fields:

- Absorption measurements with the PCI (Photo-Thermal Common-Path Interferometry) method
- Spectral response of thin film coatings
- Electro-optical response
- Conversion efficiency (generation of 532nm or OPO pumped at 1064nm)

Some additional experiments can be setup on purpose or request.

Laser bench enable us to control non linear crystals specifications